Mfg Part Number: JBP28S42MJ | NSN : 5962-01-159-5934 | NIIN : 011595934 |
CAGE Code : F2210 | Manufacturer: Texas Instrument Inc | Item Name : Microcircuit Memory |
FSC : 5962 Microcircuits Electronic |
Thank you for your continued interest in JBP28S42MJ under NSN 5962-01-159-5934 components available for purchase on Integrated Plane Parts. The Microcircuit Memory item associated with the part number JBP28S42MJ, manufactured by Texas Instrument Inc, is currently available on our database; as such, we ask that you please fill out and submit an Instant RFQ form detailing your requirements on parts needed. Details should include desired quantities, target prices, expected shipping time frames, and more, as applicable. Upon receipt of a completed form of JBP28S42MJ, our representatives will harness your provided information and formulate a solution which satisfies your operational needs in just 15 minutes or less.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-159-5934 Item Description: Microcircuit Memory | 5962 | 011595934 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
Jbp28s42mj | 3 | 2 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
CSWJ | (NON-CORE DATA) WORD QUANTITY | 512 |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
ADAQ | BODY LENGTH | 0.930 INCHES MINIMUM AND 0.990 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.185 INCHES MAXIMUM |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
ADAT | BODY WIDTH | 0.245 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
TEST | TEST DATA DOCUMENT | 94117-314048 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
AGAV | END ITEM IDENTIFICATION | AN/USM-464 TEST SET,COUNTERMEASURES |
CBBL | FEATURES PROVIDED | MONOLITHIC AND BIPOLAR AND PROGRAMMABLE AND BURN IN AND W/ENABLE |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CZER | MEMORY DEVICE TYPE | ROM |
TTQY | TERMINAL TYPE AND QUANTITY | 20 PRINTED CIRCUIT |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQZP | INPUT CIRCUIT PATTERN | 10 INPUT |
CRHL | (NON-CORE DATA) BIT QUANTITY | 4096 |
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